This workshop will provide the scientific and industrial communities a dedicated forum to present new research, developments, and applications in the field of Software Defect Prediction and Analysis. Dramatic progress has been made to increase software availability, robustness, and security. However, such improvements are often limited by the large number and heterogeneous types of defects, as well as the difficulty of defect detection. More efficient frameworks, models, algorithms and tools are needed to improve the effectiveness of defect prediction, localization, analysis, and evaluation.
The list of topics includes, but is not limited to:
Authors are invited to submit original unpublished research papers as well as industrial practice papers. Simultaneous submissions to other conferences are not permitted. Detailed instructions for electronic paper submission, panel proposals, and review process can be found at https://qrs20.techconf.org/submission.
The length of a camera ready paper will be limited to eight pages, including the title of the paper, the name and affiliation of each author, a 150-word abstract, and up to 6 keywords. Shorter version papers (up to four pages) are also allowed.
Authors must follow the IEEE Computer Society Press Proceedings Author Guidelines to prepare their papers. At least one of the authors of each accepted paper is required to pay full registration fee and present the paper at the workshop. Arrangements are being made to publish selected accepted papers in reputable journals. Submissions must be in PDF format and uploaded to the conference submission site.Submission
|Peng Liang||Wuhan University|
|Yutao Ma||Wuhan University|
|Yihao Li||Graz University of Technology|
|Jianxiao Liu||Huazhong Agricultural University|
|Zheng Li||Henan University|
|Yi Zhao||Guangdong Ocean University|
|Yiwang Huang||Tongren University|